From 7898f31b0e7a6ba1ec9c7391e7ece9e31dd93262 Mon Sep 17 00:00:00 2001 From: ChiYuan Huang Date: Tue, 19 Jul 2022 22:52:45 +0800 Subject: Documentation: ABI: testing: rtq6056: Update ABI docs Add documentation for the usage of voltage channel integration time. Signed-off-by: ChiYuan Huang Link: https://lore.kernel.org/r/1658242365-27797-4-git-send-email-u0084500@gmail.com Signed-off-by: Jonathan Cameron --- Documentation/ABI/testing/sysfs-bus-iio | 11 +++++++++++ 1 file changed, 11 insertions(+) (limited to 'Documentation/ABI') diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index e81ba6f5e1c8..7faec5b3a553 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -2038,3 +2038,14 @@ Description: Available range for the forced calibration value, expressed as: - a range specified as "[min step max]" + +What: /sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency +What: /sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency +What: /sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency +KernelVersion: 5.20 +Contact: linux-iio@vger.kernel.org +Description: + Some devices have separate controls of sampling frequency for + individual channels. If multiple channels are enabled in a scan, + then the sampling_frequency of the scan may be computed from the + per channel sampling frequencies. -- cgit